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- Perkin Elmer Lambda35 Uv-Visible Spectrophotometer
Perkin Elmer Lambda35 Uv-Visible Spectrophotometer
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SN 502S09102209
Fully tested and ready to ship. Spectrometer is in excellent condition. 30 Day Money Back Guarantee!!!
Software Loaded PC included. UV Winlab Version 6.0.4
The Perkin-Elmer Lambda™ 25/35/45 UV/Visible Spectrophotometers increase productivity by mimicking the QA workflow to generate high-quality results the first time, every time. And that’s exactly what the user needs in a busy laboratory when the pressure’s on and it’s the user's job to keep the results flowing. LAMBDA systems are easy to operate and deliver results the user can trust with the minimum of operator training. With Perkin-Elmer's complete range of LAMBDA systems it’s easy to develop simple, robust methods and ensure they’re followed without mistakes. And, whichever LAMBDA system is choosen, the user's day-to-day UV/Vis analyses will be faster, simpler and more dependable than ever before.
UV WinLab™ software works the way the user works, guiding the user through a step-by-step process that simplifies analysis from sample entry to report generation, eliminating costly mistakes and delivering rapid results. The user can rely on Perkin-Elmer's proven technology to deliver consistently high-quality results over the lifetime of the system, and the user can confirm those results with Perkin-Elmer's extensive suite of Instrument Performance Verification (IPV) tests. For FDA-regulated industries, the Enhanced Security™ (ES) version of UV WinLab integrates seamless 21 CFR Part 11 technical compliance without slowing the user down.
- FeaturesTrue Double-Beam Operation
- Sealed and Quartz-Coated High-Throughput Optics
- Fast Scanning
- Prealigned Deuterium and Tungsten Halogen Lamps
- Technical description and specifications - Lambda 35Part # L6020064
- Wavelength Range - 190-1100nm
- Bandwidth - 0.5, 1, 2, 4 nm varuabke
- Stray Light - At 220nm (Nal) < 0.01%T
- At 340 nm (NaNO2) < 0.01%T
- At 370 nm (NaNO2) < 0.01%T
- At 200 nm (KCI) < 1%T
- Wavelength Accuracy - At D2 peak (656.1 nm) ±0.1 nm
- Wavelength reproducibility - 10 measurements at 656.1 nm ±0.05 nm
- Photometric Accuracy - At 1 A using NIST 930D filter ±0.001 A
- At 2 A using NIST 1930D filter ±0.005 A
- Potassium dichromate ±0.010A
- Photometric reproducibility - Maximum deviation of 10 measurements at 1 A < 0.001 A
- Photometric stability - Stability at 1 A, at 500 nm with 2-sec. response time < 0.00015 A/hour
- Photometric noise at 500 nm (RMS) - Noise 500 nm/0 A RMS Slit 1 nm < 0.00005 A
- Baseline flatness - Slit 1 nm ±0.001 A
- Construction Solid CNC-machined aluminum chassis for thermal and vibration stability
- Optics Double-beam, sealed, quartz-coated mirrors; lens-free system to reduce chromatic aberrations
- Monochromator Seya Namioka
- Grating Holographic, concave grating with 1053 lines per mm
- Source Deuterium and Tungsten prealigned sources with automatic switch-over
- Size (W x D x H) 650 mm (25 in.) x 560 mm (22 in.) x 233 mm (9 in.)
- Weight (approx.) 26 kg (57 lbs)