Wavelength range 190 - 1100 nm
Slit width 1 nm
Resolution > 1.6
Stray light < 1.0 % At 200 nm, solution of 1.2% KCl, blank scan on air, 5 s integration
time; (EP*method)**
< 0.05 % At 220 nm, solution of 10 g/l NaI, blank scan on air, 5 s integration
time; (ASTM method)
< 0.03 % At 340 nm, solution of 50 g/l NaNO2, blank scan on air, 5 s integration
time; (ASTM method
Wavelength accuracy < ± 0.5 nm
Wavelength reproducibility < ± 0.02 nm
Photometric accuracy < ± 0.005 AU
Photometric noise< 0.0002 AU rms
Photometric stability < 0.001 AU/h
Baseline flatness < 0.001 AU rms
Typical scan time 1.5 s
Shortest scan time 0.1 s
Time until next scan 0.1 s
Slit width 1 nm
Resolution > 1.6
Stray light < 1.0 % At 200 nm, solution of 1.2% KCl, blank scan on air, 5 s integration
time; (EP*method)**
< 0.05 % At 220 nm, solution of 10 g/l NaI, blank scan on air, 5 s integration
time; (ASTM method)
< 0.03 % At 340 nm, solution of 50 g/l NaNO2, blank scan on air, 5 s integration
time; (ASTM method
Wavelength accuracy < ± 0.5 nm
Wavelength reproducibility < ± 0.02 nm
Photometric accuracy < ± 0.005 AU
Photometric noise< 0.0002 AU rms
Photometric stability < 0.001 AU/h
Baseline flatness < 0.001 AU rms
Typical scan time 1.5 s
Shortest scan time 0.1 s
Time until next scan 0.1 s